testing data compression
Packet-based input test data compression techniques
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ABSTRACT This paper presents a test input data compression technique, which can be use to reduce input test data volume, test time, and the number of required tester channels. The technique is based on grouping data packets and applying various binary encoding
A hybrid coding strategy for optimized test data compression
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ABSTRACT Store-and-generate techniques encode a given test set and regenerate the original test set during the test with the help of a decoder. Previous research has shown that run-length coding, particularly alternating run-length coding, can provide high
Alternating run-length coding a technique for improved test data compression
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Abstract Store-and-generate techniques encode a given test set and regenerate the original test set during test with the help of a decoder. They are particularly suitable for IP cores coming with pre-computed test sets, and they also offer a natural option for test resource
2n pattern run-length for test data compression
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Abstract:This paper presents a new pattern run-length compression method whose decompressor is simple and easy to implement. It encodes 2| n| runs of compatible or inversely compatible patterns, either inside a single test data segment or across multiple ABSTRACT In its first part, this paper examines various forms of embedded deterministic test with particular emphasis on input stimuli compression and test response compaction schemes. Subsequently, the Embedded Deterministic Test (EDT) scheme, which
Buckling of Stiffened Cylinders in Axial Compression and Bending: A Review of Test Data
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SUMMARY Test data on stiffened cylinders which failed by general instability under uniform axial compression and/or bending are reviewed, and the adequacy of contemporary methods for predicting buckling are appraised by comparing test data with results
Study to investigate the impact of combining response data compression techniques for built-in self test
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Abstract:In Built-In Self Test (BIST), infeasibility of response data storage forces to reduce the response data of Circuit Under Test (CUT) to relatively shorter sequences. This data targets are achieved by using response compression techniques like Signature
New approaches and limits to test data compression for systems-on-chip
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Recent advances in design technology have made it possible to build complete systems containing different types of components (also called cores) on the same chip. These complex systems-on-chips (SoCs) incorporate many different cores that cover a wide
Efficient Test Data Compression Using Transition Directed Run-length Code in System-on-a-Chip
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Abstract-A new test data compression method using Transition Directed Run-length code (TDR) is proposed. The proposed method is suitable for encoding the test set for embedded cores in a system-on-a-chip. The previous researches have shown that run-length coding
A statistical Test data compression technique with adaptive bit filling and AI based reordering: Optimization for compression and scan power
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Abstract Test power and test time have been the major issues for current scenario of VLSI testing. The hidden structure of IP cores in SoC has further exacerbated these problems. The test data compression is the well known method used to reduce the test time. The don't
Improving Reusability of Test Symbols for Test Data Compression
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In this paper, complementary Huffman coding techniques are proposed for test data compression/decompression of complex SOC designs during manufacturing testing. Instead of the compatible relationship between test data blocks, complementary features between
Test Slice Difference Technique for Low-Transition Test Data Compression
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Abstract This paper presents a low power strategy for test data compression and a new decompression scheme for test vectors. In our method, we propose an efficient algorithm for scan chain reordering to deal with the power dissipation problem. Further, we also
Test of wavelet-based seismic data compression software
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ABSTRACT In this paper, we test a new wavelet-transform based seismic data compression technique developed by Chevron. We apply this technique to two synthetic datasets and one field dataset. Our results show that this new compression approach can virtually retain all
Test data compression for system-on-a-chip using extended frequency-directed run-length (EFDR) code
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Abstract One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequencydirected run-length (FDR) code is a variable-
A Novel Test Data Compression Algorithm
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Abstract:-The circuit sizes grow ever larger, test data volume and test application time grow unwieldy in system on chip (SOC) designs. Larger test data size demands not only increase in testing time but also requires large memory. Code compression techniques address this
Low power scan testing and efcient test data compression for System-On-a-Chip
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We present a new low power scan testing and test data compression method for System-On- a Chip (SOC). The don't cares in unspecified scan vectors are mapped to binary values for low power and encoded by adaptive encoding method for higher compression. Also, the
MODIFIED AVR CODING FOR TEST DATA COMPRESSION
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Abstract: One of the major challenges in testing a Systemon-a-Chip (SOC) is dealing with the large test data size. Several test data compression techniques have been proposed to reduce the volume of test data. This paper presents a test data compression approach,
Test data compression and decompression based on modified Huffman algorithm
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Abstract There is a Huffman algorithm in typical lossless compression algorithm. It is a simple and good algorithme]. But, we can get a better compression ratio by revising a Huffman algorithm. Also a Huffman algorithm needs the big hardware to decompress data.
Test Data Compression Using Soft Computing
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ABSTRACT-One of the methods to reduce the area and power dissipation is by doing the test data compression scheme using soft computing technique. By doing the soft computing the area minimization can be achieved. The soft computing is the term applied for solving
An Efficient Test Data Compression Using Viterbi Algorithm
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Abstract-This paper presents An Efficient Test Data Compression Using Viterbi Algorithm that provides high encoding efficiency and scalability with respect to the number of test channels. Proposed numerous test vector compression technique is linear decompression
Test-Data Compression Based on Variable-to-Variablc Reusable Huffman Coding
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Abstract A new efficient statistical test data compression method, suitable for IP cores of unknown structure with multiple scan chains is proposed. Huffman, which is a well known faed-tovariabie code, is used in this paper as a variahle-to-variable code. The pre-
LOW POWER AND TEST DATA COMPRESSION IN VLSI TESTING USING NEW ENCODING SCHEME
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Abstract-Power dissipation during test is a significant problem as the size and complexity of systems-on-chip (SOCs) continue to grow. During scan shifting, more transitions occur in the flip-flops compared to what occurs during normal functional operation. This problem is
Efficient Test Data Compression Techniques using Viterbi Architecture
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Abstract: This paper presents the long data compression and the Cmos transistor count increased new fault technologies theses data compression the large data compression and storing the data are described, for provides high encoding efficiency and scalability with
Test data compression and optimal power seed selection for Scan Power Reduction
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Abstract: XOR network-based on-chip test compression schemes have been widely employed in large industrial scan designs due to their high compression ratio and efficient decompression mechanism. Due to the highly divergent power impact of distinct seeds
ON IMPROVING THE EFFECTIVENESS OF SYSTEM-ON-A-CHIP TEST DATA COMPRESSIONBASED ON EXTENDED FREQUENCY DIRECTED RUN-
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ABSTRACT One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code
Low power scan testing and test data compression
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As the size and complexity of systems-on-a-chips (SOCs) continue to grow, test data volume and test power consumption have increased dramatically. A large amount of test data causes long test time and a large memory requirement on the tester. Large power In a large circuit it is common to find that an output of the circuit depends structurally on a proper subset of the circuit inputs. We use this observation to provide test data compression. The proposed approach can be used in addition to test data compression techniques
Test data compression using nine coded run length based Huffman coding
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Abstract: In this paper, we present an compression technique to reduce the test patter volume in scan test applications. We have proposed an encoding scheme which is run- length based Huffman coding (RLHC). This encoding scheme together with the nine-
TEST DATA COMPRESSION BASED ON GOLOMB CODING AND TWO-VALUE GOLOMB CODING
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ABSTRACT: In this paper, we discuss test data compression and decompression method based on variable length Golomb codes and 2-V Golomb Codes for test data. The method is targeted to minimize the amount of test data, which reduces the size of memory required in
Test Data Compression Using a New Scheme Based on Extended Variable Length Codes
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Abstract: The need of testing large amount of data in large ICs has increased the time and memory requirement by many folds. Several test data compression schemes have been proposed for reducing the test data volume. In this paper, we propose a novel, lossless,
Systems-on-Chip: Use of Test Data Compression Technique to Reduce Test Time
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Abstract:During the production phase of microelectronics systems, one of the fundamental step is to check if the system works fine. This step is called the test of integrated circuits. Furthermore, cost reduction of these tests has become a major axe of research in
A Novel Approach to Test Data Compression for BIST and its Implementation
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Abstract In this paper, a newly fangled test data compression technique for the deterministic Built-In-Self Test (BIST) is proposed. The main focus of this paper is to reduce memory storage requirement of the test vectors without any modification in the test application time.
Cluster Based LFSR Reseeding for Test Data Compression
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Abstract: Today's System-on-Chip (SoC) represent high-complexity and it is moving towards the challenge of huge test patterns, more accessing time and larger power consumption. Test data compression is done to improve the test quality. This study presents a test
Enhanced Compression Code for SOC Test Data Volume Reduction
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Abstract Test data reduction is an important issue for the system-on-a-chip designs. A number of coding techniques have been developed in the past to compress the test data to achieve the best compression. In this paper we have merged two run length based codes
An Innovative Test Data Compression Method Using Scan Chain Compaction
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Abstract: Test data compression method is a key issue for reducing test data volume and test application time. Various techniques have been developed with great success on dealing with data compression. The previous schemes of compression techniques have been
A New Test Data Compression for Low Power Test
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Abstract This paper proposes a new test data compres-sion method for low power testing. To improve compression ratio, the proposed scheme uses the modified input reduction and novel techniques, a new scan flip-flop reordering algorithm and a newly proposed one
SoC Test Data Compression Technique Based on RLE-G
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Abstract. Test data compression has been an effective way to reduce test data volume and test time, as well as to solve automatic test equipment (ATE) memory and bandwidth limitation. We analyze the limitations of current test data compression algorithm and draw
A Combined Compatible Block Coding and Run Length Coding Techniques for Test Data Compression
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Abstract: Higher Circuit Densities in system-on-chip (SOC) designs and increase in design complexity have led to drastic increase in test data volume. This results in long test application time and high tester memory requirement. Test Data Compression/
A Review on-Low Power Testing Scheme For System-On-Chip Using Test Data Compression And Pattern Recombination
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ABSTRACT-Testing SOCs, require large volume of test data as well as more testing time to transmit test data to cores from TAM (Test Access Mechanism). The large test data and test power dissipation are concerns of cost and security in testing SOC cores. The power
Test Data Compression Architecture for Lowpower VLSI Testing
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Abstract: With the ever increasing integration capability of semiconductor technology, today's large integrated circuits requires an increasing amount of data for testing which increases test time and elevated requirements of tester memory. Larger test data sizes not only
Incheol Kim, Sungho Kang, Yonsei Universiry 13: 20~ 13: 40 A New Low Power Scan Architecture Considering Test Data Compression Hong-Sik Kim, Beom
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Abstract The Costas-loop is commonly used in BPSK demodulation. But it is very difficulty to implement the low-pass-filter for a high frequency carrier. This paper analyzes the Costas- loop as a phase-trackingarchitecture and proposes a new BPSK demodulation scheme Subhasish Mitra for his help with the transcription and in facilitating the review of these comments. Test data volume continues to grow at an alarming rate. This has given rise to a search for effective techniques to reduce the amount of data that must be transferred
DISTANCE BASED REORDERING FOR TEST DATA COMPRESSION
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ABSTRACT The system-on-chip (SoC) revolution imposes a threat in the area of power dissipation by challenging designing as well as the testing process. Basically, a circuit or a system consumes more power in test mode than in normal mode. This increase in test
Test data compression using multiple run length code technique
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Abstract System on chip is challenging, for both design and testing engineers due to its increase in power consumption. In test mode, the volume of the test data is extremely high when compared to normal mode, the switching activity which takes place between the test
Compression/Scan Co-design for Reducing Test Data Volume, Scan-in PowerDissipation, and Test Application Time
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Member suMMARY LSI testing is critical to guarantee chips are fault- free before they are integrated in a system, so as to increase the reliability of the system.
Entropy Coding Technique for Compression of Satellite Vibration Test Data
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Abstract:Entropy coding is an important stage in any compression algorithm. During compression process, data is transformed from one domain to another domain to make use of the redundancy present in the data. The size of the resultant transformed data is less
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